Polarization Characteristics of Surface Plasmon Resonance in SnO2 Nanocluster Films
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Дата
2011
Науковий керівник
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Анотація
Internal reflection features caused by the surface plasmon resonance in nanoscale films contain
ing defect tin dioxide clusters in the stoichiometric dielectric matrix are studied by the method of polarization
modulation of electromagnetic radiation. The angular and spectral characteristics of reflectances and
of s and p polarized radiation and their polarization difference ρ = – are measured in the wavelength
range λ = 400–1600 nm. The experimental characteristics ρ(θ, λ) (θ is the radiation incidence angle)
obtained represent the optical property features associated with the film structure and morphology. Surface
plasmon polaritons and local plasmons excited by s and p polarized radiation are detected; their frequency
and relaxation properties are determined. The structural sensitivity of the technique for studying the surface
plasmon resonance for tin dioxide films is shown.
Опис
Ключові слова
plasmon resonance, electromagnetic, radiation
Бібліографічний опис
Физика и техника полупроводников