Перегляд за Автор "Matiash, I. E."

Зараз показуємо 1 - 5 з 5
  • Ескіз
    Документ
    Classic and Topologic Dimensional Effects in SnO2 Thin Films Detected by Surface Plasmon Resonance Technique
    (SciTechnol, 2013) Hrinevych, Viktor S.; Filevska, Liudmila M.; Maximenko, L. S.; Matiash, I. E.; Mischuk, O. N.; Rudenko, S. P.; Serdeha, B. K.; Smyntyna, Valentyn A.
    Internal reflection features caused by the surface plasmon resonance in nanoscale films containing defect tin dioxide clusters in the stoichiometric dielectric matrix are studied by means of polarization modulation of electromagnetic radiation. The angular and spectral characteristics of reflectances Rs2 and Rp2 of s- and p-polarized radiation and their polarization difference ρ=Rs2–Rp2 are measured in the wavelength range λ=400-1600 nm. The obtained experimental characteristics ρ(θ, λ) (θ is the radiation incidence angle) represent the optical property features associated with the film structure and morphology. Surface plasmon polaritons and local plasmons excited by s- and p-polarized radiation are detected; their frequency and relaxation properties are determined. The technique employed for studying surface plasmon resonance in tin dioxide films is appeared to be structurally sensitiv
  • Ескіз недоступний
    Документ
    Optical constants detection in tin dioxide nano-size layers by surface plasmon resonance investigation
    (2011) Serdeha, B. K.; Matiash, I. E.; Maksymenko, L. S.; Rudenko, S. P.; Smyntyna, Valentyn A.; Hrinevych, Viktor S.; Filevska, Liudmila M.; Ulug, B.; Ulug, A.; Yucel, B. M.
    Optical constants of tin dioxide nano-size layers were detected using surface plasmons resonance research technique. Squared reflectance indexes difference as well as the ones with s- and p-polarized light are measured simultaneously. Obtained in the work the refraction coefficient of the tin dioxide film gives the possibility to judge about the structural perfection of the layer and confirms that the film has significant porosity, which is created during the decomposition of the polymer materials used as structuring additives. It is shown that the resonance condition for surface plasmons may be destroyed through the interaction of surface plasmons with surface roughness potential of the film (medium dielectric properties variation).
  • Ескіз
    Документ
    Polarization Characteristics of Surface Plasmon Resonance in SnO2 Nanocluster Films
    (2011) Hrinevych, Viktor S.; Maksymenko, L. S.; Matiash, I. E.; Mischuk, O. N.; Rudenko, S. P.; Serdeha, B. K.; Smyntyna, Valentyn A.; Filevska, Liudmila M.
    Internal reflection features caused by the surface plasmon resonance in nanoscale films contain ing defect tin dioxide clusters in the stoichiometric dielectric matrix are studied by the method of polarization modulation of electromagnetic radiation. The angular and spectral characteristics of reflectances and of s and p polarized radiation and their polarization difference ρ = – are measured in the wavelength range λ = 400–1600 nm. The experimental characteristics ρ(θ, λ) (θ is the radiation incidence angle) obtained represent the optical property features associated with the film structure and morphology. Surface plasmon polaritons and local plasmons excited by s and p polarized radiation are detected; their frequency and relaxation properties are determined. The structural sensitivity of the technique for studying the surface plasmon resonance for tin dioxide films is shown.
  • Ескіз
    Документ
    Tin dioxide nanofilms as sensitive detectors for surface plasmon resonance phenomenon
    (2011) Hrinevych, Viktor S.; Matiash, I. E.; Maksymenko, L. S.; Mischuk, O. N.; Rudenko, S. P.; Serdeha, B. K.; Smyntyna, Valentyn A.; Filevska, Liudmila M.
    Peculiarities of internal reflections, caused by surface plasmon resonance in nanosized composite films containing faulty tin dioxide clusters in stoichiometric matrix were studied. The angle and spectral characteristics of Rs 2 and Rp 2 reflection indexes of radiation with s- and p-polarization, both with their polarization difference ρ=Rs 2-Rp 2 are measured in the waves range of 400-1600 nm. The obtained experimental ρ(θ, λ) characteristics reflect the optical properties’ peculiarities, connected with films’ structure and morphology. The surface plasmon resonance investigation procedure is established to be sensitive for tin dioxide films’ structure.
  • Ескіз
    Документ
    Поляризационные характеристики поверхноcтного плазмонного резонанса в нанокластерных пленках SnO2
    (2011) Гриневич, Виктор Сергеевич; Максименко, Л. С.; Матяш, И. Е.; Мищук, О. Н.; Руденко, С. П.; Сердега, Борис Кирилович; Смынтына, Валентин Андреевич; Филевская, Людмила Николаевна; Hrinevych, Viktor S.; Maksymenko, L. S.; Matiash, I. E.; Myshchuk, O. N.; Rudenko, S. P.; Serdeha, B. K.; Smyntyna, Valentyn A.; Filevska, Liudmila M.
    Методом поляризационной модуляции электромагнитного излучения исследованы особенности внутреннего отражения, обусловленные поверхностным плазмонным резонансом в наноразмерных пленках, содержащих кластеры дефектного диоксида олова в диэлектрической матрице стехиометрического состава. В диапазоне длин волн 2 = 400—1600 нм измерены угловые и спектральные характеристики коэффициентов отражения R2 и R2p излучения s- и р-поляризации и их поляризационной разности р = R2—R2p. Полученные экспериментальные характеристики р(6, 2) (в — угол падения излучения) отражают особенности оптических свойств, связанные со структурой и морфологией пленок. Обнаружены поверхностные плазмон-поляритоны, а также локальные плазмоны, возбуждаемые s- и р-поляризованным излучением, определены их частотные и релаксационные свойства. Установлена структурная чувствительность методики исследования поверхностного плазмонного резонанса для пленок диоксида олова.