Optical constants detection in tin dioxide nano-size layers by surface plasmon resonance investigation
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Дата
2011
Науковий керівник
Укладач
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ISSN
E-ISSN
Назва тому
Видавець
Анотація
Optical constants of tin dioxide nano-size layers were detected using surface plasmons resonance research
technique. Squared reflectance indexes difference as well as the ones with s- and p-polarized light are measured
simultaneously. Obtained in the work the refraction coefficient of the tin dioxide film gives the possibility to judge
about the structural perfection of the layer and confirms that the film has significant porosity, which is created during
the decomposition of the polymer materials used as structuring additives. It is shown that the resonance condition
for surface plasmons may be destroyed through the interaction of surface plasmons with surface roughness potential
of the film (medium dielectric properties variation).
Опис
Ключові слова
tin dioxide, nano-size, roughness potential
Бібліографічний опис
Физика и техника полупроводников