Tin dioxide nanofilms as sensitive detectors for surface plasmon resonance phenomenon

Скорочена інформація про документ
dc.contributor.authorHrinevych, Viktor S.
dc.contributor.authorMatiash, I. E.
dc.contributor.authorMaksymenko, L. S.
dc.contributor.authorMischuk, O. N.
dc.contributor.authorRudenko, S. P.
dc.contributor.authorSerdeha, B. K.
dc.contributor.authorSmyntyna, Valentyn A.
dc.contributor.authorFilevska, Liudmila M.
dc.date.accessioned2017-11-30T10:25:09Z
dc.date.available2017-11-30T10:25:09Z
dc.date.issued2011
dc.description.abstractPeculiarities of internal reflections, caused by surface plasmon resonance in nanosized composite films containing faulty tin dioxide clusters in stoichiometric matrix were studied. The angle and spectral characteristics of Rs 2 and Rp 2 reflection indexes of radiation with s- and p-polarization, both with their polarization difference ρ=Rs 2-Rp 2 are measured in the waves range of 400-1600 nm. The obtained experimental ρ(θ, λ) characteristics reflect the optical properties’ peculiarities, connected with films’ structure and morphology. The surface plasmon resonance investigation procedure is established to be sensitive for tin dioxide films’ structure.uk
dc.identifier.citationEurosensors XXV, September 4-7, 2011, Athens, Greece. Procedia Engi-neering 25 (2011)uk
dc.identifier.urihttps://dspace.onu.edu.ua/handle/123456789/11626
dc.language.isoenuk
dc.subjecttin dioxide nanofilmsuk
dc.subjectsurface plasmon resonanceuk
dc.titleTin dioxide nanofilms as sensitive detectors for surface plasmon resonance phenomenonuk
dc.typeArticleuk
Файли
Зібрання
Статті та доповіді ФМФІТ