Gevelyuk, Serhii A.Doicho, Ihor K.Mak, Vasyl T.Safronsky, E. D.Vorobyova, V. A.2018-06-072018-06-072005Фотоэлектроника = Photoelectronicshttps://dspace.onu.edu.ua/handle/123456789/16704A method of inner surface morphology investigation in porous glass using modified Michelson’s interferometer is presented. The possibility of residual silica gel detection in pores by interferometric measurements is shown. The method also allows to distinguish the role of compressing and stretching forces in the mechanical deformation of porous samples. The proposed method is convenient to study the effect of additional treatments on the removal of residual silica gel out of porous glasses. Interferometric measurements make it possible to minimize the mechanical deformations of a porous layer on a solid substrate by tuning the layers thickness ratio.enmechanicalinterferometricmodifiedmorphologyArticle