Viter, Roman V.Smyntyna, Valentyn A.Yevtushenko, Nina H.2018-06-072018-06-072005Фотоэлектроника = Photoelectronicshttps://dspace.onu.edu.ua/handle/123456789/16692This paper describes investigation of structural properties of nanocrystalline tin dioxide films deposited by electrostatic spray pyrolisis method. Average crystalline size measured from XRD methods was 3,5±0,8 nm and 5,8±0,9 nm for films deposited on glass and alumina substrates. Sensitivity of tin dioxide thin films to ethanol was measured under different ethanol concentrations. Annealing temperature influence on crystalline size and sensitive properties was studied.enSn02thin filmsgas sensitivityethanolArticle