Morphological Features of Nanostructured Sensor for X-Ray and Optical Imaging, Based on Nonideal Heterojunction

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dc.contributor.authorBrytavskyi, Ie.
dc.contributor.authorSmyntyna, Valentyn A.
dc.contributor.authorBorschak, V. A.
dc.date.accessioned2017-10-23T08:13:42Z
dc.date.available2017-10-23T08:13:42Z
dc.date.issued2016
dc.description.abstractA novel nanostructured sensor for X-ray and optical images obtaining is developed on the basis of nonideal heterojunction CdS-Cu2S. Microscopy studies have been conducted to determine the optimum method of sensor manufacturing. The analysis of the original data set with microscopic image comparison of polycrystalline films on different technological parameters showed that the most homogeneous surface structure presents on samples, which CdS layer is obtained by vacuum thermal evaporation of CdS layer. This finding is consistent with results of current-voltage characteristics analysis, which showed the presence of high quality CdS-Cu2S heterostructure, obtained by mentioned base layer forming methodicsuk
dc.identifier.citationJ. Bonˇca, S. Kruchinin (eds.), Nanomaterials for Security, NATO Science for Peace and Security Series A: Chemistry and Biologyuk
dc.identifier.urihttps://dspace.onu.edu.ua/handle/123456789/11127
dc.language.isoenuk
dc.relation.ispartofseries;Chapter 18
dc.subjectnanostructured sensor for X-ray and optical imagesuk
dc.subjectheterojunction CdS-Cu2Suk
dc.subjectMicroscopy studiesuk
dc.titleMorphological Features of Nanostructured Sensor for X-Ray and Optical Imaging, Based on Nonideal Heterojunctionuk
dc.typeArticleuk
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