Physical problems of the reliability of sensors based on A2B6 semiconductor compounds
dc.contributor.author | Hrinevych, Viktor S. | |
dc.contributor.author | Smyntyna, Valentyn A. | |
dc.date.accessioned | 2017-11-28T08:10:56Z | |
dc.date.available | 2017-11-28T08:10:56Z | |
dc.date.issued | 1989 | |
dc.description.abstract | The sensors were made using the technology for vacuum deposition of the original material on an insulating substrate. In this case, a film of thickness 1 pin was formed which was equipped with planar indium ohmic contacts. The electrode gap was 2 mm. At the operating temperature, such sensors function mainly under conditions of changing current and resistance when exposed to a variation in gas concentration. | uk |
dc.identifier.citation | Тезисы докладов Всесоюзной конференции "Химические сенсоры - 89". Ленинград, 1989 г. Т.2.- С.188. | uk |
dc.identifier.uri | https://dspace.onu.edu.ua/handle/123456789/11562 | |
dc.language.iso | en | uk |
dc.relation.ispartofseries | ;Т. 2. | |
dc.subject | physical problems | uk |
dc.subject | reliability | uk |
dc.subject | sensors | uk |
dc.subject | semiconductor compounds | uk |
dc.title | Physical problems of the reliability of sensors based on A2B6 semiconductor compounds | uk |
dc.type | Article | uk |
Файли
Контейнер файлів
1 - 1 з 1
Ліцензійна угода
1 - 1 з 1
Ескіз недоступний
- Назва:
- license.txt
- Розмір:
- 1.71 KB
- Формат:
- Item-specific license agreed upon to submission
- Опис: