Physical problems of the reliability of sensors based on A2B6 semiconductor compounds

dc.contributor.authorHrinevych, Viktor S.
dc.contributor.authorSmyntyna, Valentyn A.
dc.date.accessioned2017-11-28T08:10:56Z
dc.date.available2017-11-28T08:10:56Z
dc.date.issued1989
dc.description.abstractThe sensors were made using the technology for vacuum deposition of the original material on an insulating substrate. In this case, a film of thickness 1 pin was formed which was equipped with planar indium ohmic contacts. The electrode gap was 2 mm. At the operating temperature, such sensors function mainly under conditions of changing current and resistance when exposed to a variation in gas concentration.uk
dc.identifier.citationТезисы докладов Всесоюзной конференции "Химические сенсоры - 89". Ленинград, 1989 г. Т.2.- С.188.uk
dc.identifier.urihttps://dspace.onu.edu.ua/handle/123456789/11562
dc.language.isoenuk
dc.relation.ispartofseries;Т. 2.
dc.subjectphysical problemsuk
dc.subjectreliabilityuk
dc.subjectsensorsuk
dc.subjectsemiconductor compoundsuk
dc.titlePhysical problems of the reliability of sensors based on A2B6 semiconductor compoundsuk
dc.typeArticleuk
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