An Interferometric Method of Inner surface Morphology Investigation in Porous Glass
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Дата
2005
Науковий керівник
Укладач
Редактор
Назва журналу
ISSN
E-ISSN
Назва тому
Видавець
Одеський національний університет імені І. І. Мечникова
Анотація
A method of inner surface morphology investigation in porous glass using modified
Michelson’s interferometer is presented. The possibility of residual silica gel detection in
pores by interferometric measurements is shown. The method also allows to distinguish
the role of compressing and stretching forces in the mechanical deformation of porous
samples. The proposed method is convenient to study the effect of additional treatments
on the removal of residual silica gel out of porous glasses. Interferometric measurements
make it possible to minimize the mechanical deformations of a porous layer on a solid
substrate by tuning the layers thickness ratio.
Опис
Ключові слова
mechanical, interferometric, modified, morphology
Бібліографічний опис
Фотоэлектроника = Photoelectronics