Classic and Topologic Dimensional Effects in SnO2 Thin Films Detected by Surface Plasmon Resonance Technique
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Дата
2013
Науковий керівник
Укладач
Редактор
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Назва тому
Видавець
SciTechnol
Анотація
Internal reflection features caused by the surface plasmon resonance in nanoscale films containing defect tin dioxide clusters
in the stoichiometric dielectric matrix are studied by means of polarization modulation of electromagnetic radiation. The angular
and spectral characteristics of reflectances Rs2 and Rp2 of s- and p-polarized radiation and their polarization difference ρ=Rs2–Rp2
are measured in the wavelength range λ=400-1600 nm. The obtained experimental characteristics ρ(θ, λ) (θ is the radiation
incidence angle) represent the optical property features associated with the film structure and morphology. Surface plasmon polaritons and local plasmons excited by s- and p-polarized radiation are detected; their frequency and relaxation properties are determined.
The technique employed for studying surface plasmon resonance in tin dioxide films is appeared to be structurally sensitiv
Опис
Journal of Nanomaterials & Molecular Nanotechnology. - 2013.
Ключові слова
Tin dioxide, Thin film, Surface Plasmon resonance
Бібліографічний опис
Journal of Nanomaterials & Molecular Nanotechnology