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Title: Structural properties of Nanocrystalline Tin dioxide Films Deposited by electrostatic Spray Pyrolisis Method
Authors: Viter, Roman V.
Smyntyna, Valentyn A.
Yevtushenko, Nina H.
Citation: Фотоэлектроника = Photoelectronics
Issue Date: 2005
Publisher: Одеський національний університет імені І. І. Мечникова
Keywords: Sn02
thin films
gas sensitivity
Series/Report no.: ;Вип. 14.
Abstract: This paper describes investigation of structural properties of nanocrystalline tin dioxide films deposited by electrostatic spray pyrolisis method. Average crystalline size measured from XRD methods was 3,5±0,8 nm and 5,8±0,9 nm for films deposited on glass and alumina substrates. Sensitivity of tin dioxide thin films to ethanol was measured under different ethanol concentrations. Annealing temperature influence on crystalline size and sensitive properties was studied.
Other Identifiers: UDC 535.34.548.0
Appears in Collections:Photoelectronics

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