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http://dspace.onu.edu.ua:8080/handle/123456789/11627
Title: | Atom Force Microscopy of SnO2 Nano Layers |
Authors: | Filevska, Liudmila M. Smyntyna, Valentyn A. Hrinevych, Viktor S. |
Citation: | IEEE International Semiconductor Conference (CAS 2006). |
Issue Date: | 2006 |
Keywords: | gas sensitivity applied solutions need |
Abstract: | The gas sensitivity applied problems solutions need a consideration and detailed investigation of the material's electronic and ionic subsystems' behavior. These systems' behavior at their own turn is tightly connected with the structure and morphology of surfaces. The morphology investigations results are given for the SnO2 layers obtained with the polymers usage. |
URI: | http://dspace.onu.edu.ua:8080/handle/123456789/11627 |
Other Identifiers: | DOI: 10.1109/SMICND.2006.283932 |
Appears in Collections: | Статті та доповіді ФМФІТ |
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