Tin dioxide nanofilms as sensitive detectors for surface plasmon resonance phenomenon
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Дата
2011
Науковий керівник
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Анотація
Peculiarities of internal reflections, caused by surface plasmon resonance in nanosized composite films containing
faulty tin dioxide clusters in stoichiometric matrix were studied. The angle and spectral characteristics of Rs
2
and Rp
2
reflection indexes of radiation with s- and p-polarization, both with their polarization difference ρ=Rs
2-Rp
2 are
measured in the waves range of 400-1600 nm. The obtained experimental ρ(θ, λ) characteristics reflect the optical
properties’ peculiarities, connected with films’ structure and morphology. The surface plasmon resonance
investigation procedure is established to be sensitive for tin dioxide films’ structure.
Опис
Ключові слова
tin dioxide nanofilms, surface plasmon resonance
Бібліографічний опис
Eurosensors XXV, September 4-7, 2011, Athens, Greece. Procedia Engi-neering 25 (2011)