The analysis of electrical processes in semiconductor cadmium selensde layers, caused by the structural transformations. Possible applications
Hrinevych, Viktor S.
Smyntyna, Valentyn A.
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The physical conditions of functioning of sensitive element for the elastic deformations registration In the microvolume of electronic systems are analysed. The sensitive element is a semiconductor pollycrystalllne film containing crystallites of two structure phases of (ot+p)CdSe. The considerable mechanical tensions arise at the Intergrain boundary of the said a and p crystallites. The result of that can be registered electrically In the form of the sharp change of current (equiltbrlous conductivity) In the circuit containing the sensitive element.
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