Morphological Features of Nanostructured Sensor for X-Ray and Optical Imaging, Based on Nonideal Heterojunction
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Дата
2016
Науковий керівник
Укладач
Редактор
Назва журналу
ISSN
E-ISSN
Назва тому
Видавець
Анотація
A novel nanostructured sensor for X-ray and optical images obtaining is
developed on the basis of nonideal heterojunction CdS-Cu2S. Microscopy studies have been conducted to determine the optimum method of sensor manufacturing. The analysis of the original data set with microscopic image comparison of polycrystalline films on different technological parameters showed that the most homogeneous surface structure presents on samples, which CdS layer is obtained by vacuum thermal evaporation of CdS layer. This finding is consistent with results of current-voltage characteristics analysis, which showed the presence of high quality CdS-Cu2S heterostructure, obtained by mentioned base layer forming methodics
Опис
Ключові слова
nanostructured sensor for X-ray and optical images, heterojunction CdS-Cu2S, Microscopy studies
Бібліографічний опис
J. Bonˇca, S. Kruchinin (eds.), Nanomaterials for Security, NATO Science for Peace and Security Series A: Chemistry and Biology