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Title: Morphological Features of Nanostructured Sensor for X-Ray and Optical Imaging, Based on Nonideal Heterojunction
Authors: Brytavskyi, Ie.
Smyntyna, Valentyn A.
Borschak, V. A.
Citation: J. Bonˇca, S. Kruchinin (eds.), Nanomaterials for Security, NATO Science for Peace and Security Series A: Chemistry and Biology
Issue Date: 2016
Keywords: nanostructured sensor for X-ray and optical images
heterojunction CdS-Cu2S
Microscopy studies
Series/Report no.: ;Chapter 18
Abstract: A novel nanostructured sensor for X-ray and optical images obtaining is developed on the basis of nonideal heterojunction CdS-Cu2S. Microscopy studies have been conducted to determine the optimum method of sensor manufacturing. The analysis of the original data set with microscopic image comparison of polycrystalline films on different technological parameters showed that the most homogeneous surface structure presents on samples, which CdS layer is obtained by vacuum thermal evaporation of CdS layer. This finding is consistent with results of current-voltage characteristics analysis, which showed the presence of high quality CdS-Cu2S heterostructure, obtained by mentioned base layer forming methodics
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